Micron Technology, Inc.
PHASE CHANGE MEMORY CELL WITH CONSTRICTION STRUCTURE

Abstract:

Some embodiments include methods of forming memory cells. Such methods can include forming a first electrode, a second electrode, and a memory element directly contacting the first and second electrodes. Forming the memory element can include forming a programmable portion of the memory element isolated from the first electrode by a first portion of the memory element and isolated from the second electrode by a second portion of the memory element, Other embodiments are described.