Micron Technology, Inc.
INTELLIGENT MEMORY DEVICE TEST RESOURCE

Abstract:

A memory device test resource includes a dedicated processing device for the memory device test resource, the dedicated processing device configured to facilitate testing of a memory device of a memory sub-system coupled to the memory device test resource. The memory device test resource further includes a memory sub-system interface port coupled to the dedicated processing device and configured to couple the memory device test resource to the processing device, a test condition component coupled to the dedicated processing device and configured to generate a test condition at the memory device test resource, and a test resource monitoring component coupled to the dedicated processing device and configured to monitor one or more conditions at the memory device test resource.