Micron Technology, Inc.
READ LEVEL EDGE FIND OPERATIONS IN A MEMORY SUB-SYSTEM

Abstract:

The present disclosure is directed to read level edge find operations in a memory sub-system. A processing device performs operations including receiving a request to locate one or more distribution edges of one or more programming distributions of a memory cell, the request specifying a target error rate for the one or more programming distributions, measuring at least one error rate sample of a first programming distribution selected from the one or more programming distributions, and determining a location of a first distribution edge of the first programming distribution at the target error rate based on a comparison of the at least one error rate sample of the first programming distribution against the target error rate.