Micron Technology, Inc.
METHODS OF FORMING TUNGSTEN STRUCTURES

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Abstract:

Described are methods for forming a multilayer conductive structure for semiconductor devices. A seed layer is formed comprising a metal and an additional constituent that in combination with the metal inhibits nucleation of a fill layer of the metal formed over the seed layer. Tungsten may be doped or alloyed with silicon to form the seed layer, with a tungsten fill being formed over the seed layer.

Status:
Application
Type:

Utility

Filling date:

23 Nov 2020

Issue date:

17 Jun 2021