Micron Technology, Inc.
DRAGGING FIRST PASS READ LEVEL THRESHOLDS BASED ON CHANGES IN SECOND PASS READ LEVEL THRESHOLDS

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Abstract:

A processing device performs a multi-pass programming operation on the memory device resulting in first pass programming distributions and second pass programming distributions. One or more read level thresholds between the second pass programming distributions are changed. Responsive to changing the one or more read level thresholds between the second pass programming distributions, one or more read level thresholds between the first pass programming distributions are adjusted based on the changes to the one or more read level thresholds between the second pass programming distributions.

Status:
Application
Type:

Utility

Filling date:

4 Dec 2020

Issue date:

17 Jun 2021