Micron Technology, Inc.
WAFER STORAGE DEVICES CONFIGURED TO MEASURE PHYSICAL PROPERTIES OF WAFERS STORED THEREIN, ASSOCIATED METHODS, AND APPARATUS

Abstract:

A wafer storage device may include one or more mutually aligned rails extending from two opposing side walls, each pair of mutually aligned rails configured to support a wafer between the side walls. The wafer storage device includes one or more sensors coupled to at least some of the one or more rails. The one or more sensors may be configured to detect a physical property of the wafer. The wafer storage device may further include a processor configured to analyze data from the one or more sensors, and a memory device. The memory device may be configured to store data produced by at least the one or more sensors or the processor. The wafer storage device may also include a power storage device configured to receive power from an external source and supply power to the one or more sensors and the processor.