National Instruments Corporation
Method and apparatus for simultaneously testing a component at multiple frequencies

Abstract:

A method and apparatus for simultaneously testing a component at multiple frequencies is disclosed. A digital processing circuit may generate a digital representation of a signal having a plurality of sine waves, each having a unique frequency. The digital representation may be converted into an analog signal, and applied to a device under test (DUT). A first analog-to-digital converter (ADC) may be coupled to measure voltages across the DUT, while a second ADC may be coupled to measure currents through the DUT. Voltage and current signals received by the first and second ADCs, respectively, may be converted into first and second digital values. Voltage and current values at each unique frequency are determined from the first and second digital values. Using the voltage and current values for each unique frequency, a frequency response of the component (e.g., an impedance) over a range of frequencies may be determined.