Oracle Corporation
Pattern-based automated test data generation

Abstract:

Systems and methods described herein are directed towards a test data generator. In some examples, a reference polygon may be received from an application. Additionally a control parameter may be received from the application. Two points on a map may be selected and a path between the two points may be generated. Additional points may be created along the path and test may be generated by processing the additional points. The test data may be provided to the application.