QUALCOMM Incorporated
INTEGRATED DEVICE COMPRISING PERIPHERY STRUCTURE CONFIGURED AS AN ELECTRICAL GUARD RING AND A CRACK STOP

Abstract:

An integrated device that includes a substrate, a circuit region located over the substrate, a design keep out region located over the substrate, and a periphery structure located over the substrate. The design keep out region laterally surrounds the circuit region. The periphery structure includes a first plurality of interconnects that laterally surrounds the design keep out region. The periphery structure is configured to operate as an electrical seal ring and a mechanical crack stop.