QUALCOMM Incorporated
FIELD EFFECT TRANSISTOR (FET) COMPRISING INNER SPACERS AND VOIDS BETWEEN CHANNELS

Last updated:

Abstract:

An integrated device that includes a substrate and a first transistor formed over the substrate. The first transistor includes a first source disposed over the substrate, a first drain disposed over the substrate, a first plurality of channels coupled to the first source and the first drain, where the first plurality of channels is located between the first source and the first drain; at least one inner spacer located between two adjacent channels from the first plurality of channels; at least two voids located between the two adjacent channels; and a first gate surrounding the first plurality of channels.

Status:
Application
Type:

Utility

Filling date:

6 May 2020

Issue date:

11 Nov 2021