QUALCOMM Incorporated
INTERTWINED WELL CONNECTION AND DECOUPLING CAPACITOR LAYOUT STRUCTURE FOR INTEGRATED CIRCUITS

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Abstract:

A substrate tie cell on an IC is provided. The substrate tie cell includes a diffusion region. The diffusion region is a p-type diffusion region on or within a p-type substrate, an n-type diffusion region on or within an n-type well within a p-type substrate, an n-type diffusion region on or within an n-type substrate, or a p-type diffusion region on or within a p-type well within an n-type substrate. The substrate tie cell further includes a plurality of adjacent gate interconnects (n adjacent gate interconnects) extending over the diffusion region, where n.gtoreq.4. The diffusion region is configured to be at one of a first voltage or a second voltage, and the gate interconnects are configured to be at an other of the first voltage or the second voltage. In one configuration, the first voltage is a power supply voltage and the second voltage is a ground voltage.

Status:
Application
Type:

Utility

Filling date:

1 Jun 2020

Issue date:

2 Dec 2021