QUALCOMM Incorporated
On-chip clock controller (OCC) manager based turbo capture clocking

Abstract:

Aspects of the disclosure are directed to clock management. In accordance with one aspect, a clock management apparatus for built-in self-test (BIST) circuitry includes a plurality of local clock controllers; a plurality of clock generators coupled to the plurality of local clock controllers; a master clock controller coupled to the plurality of clock generators; an X-tolerant logical built-in self test (XLBIST) circuit coupled to the master clock controller; and a test access port (TAP) coupled to the XLBIST circuit.