QUALCOMM Incorporated
Sensor-driven systems and methods to activate and deactivate beam scanning

Abstract:

The apparatus is configured to performing a beam scan operation. The beam scan operation may be part of an active beam scanning process. The apparatus is also configured to deactivate the beam scan process upon determining that the apparatus is in a first state corresponding to at least one of a first set of conditional states. The apparatus is configured to determine a state change of the apparatus. Additionally, the apparatus is configured to activating the beam scanning process upon determining that the apparatus is in a second state corresponding to at least one of a second set of conditional states different from the first set of states. The apparatus is also configured to performing the beam scan operation upon activating the beam scanning process.