Silicon Laboratories Inc.
Regulator control during scan shift and capture cycles

Abstract:

During scan testing a voltage regulator is programmed to supply a first voltage to logic under test during a shift portion of the scan test, a second voltage during a first portion of a capture portion of the scan test and at least a third voltage during a second portion of the capture portion of the scan test. The availability of a programmable voltage regulator during shift and capture portions of scan testing allows a less stressful voltage to be used during a shift portion of the scan test to reduce shift failures and allows various voltages to be used during capture portions of the scan testing as a surrogate for testing at different temperatures and to provide more flexibility in testing margins.