Silicon Laboratories Inc.
Transition scan coverage for cross clock domain logic

Abstract:

In order to increase test coverage of integrated circuits with multiple clock domains, during a capture portion of a scan test, the functional clock signals, associated with a respective one of the clock domains are synchronized to ensure back and forth capture between the faster and slower clock domain. Each of the plurality of clock signals is generated such that an active edge of each faster clock signal occurs one clock period of the faster clock signal before an active edge of each slower clock signal.