Synopsys, Inc.
Clock domain crossing verification of integrated circuit design using parameter inference

Abstract:

Techniques for verification of integrated circuit design are disclosed. A design relating to an integrated circuit is received (102). The design includes a first parameterized element and a second parameterized element (104). The first parameterized element is identified as a do-not-care (DNC) element based on usage of the first parameterized element in the design (106). A plurality of models relating to the design are generated by a processing device (110). A first value of the first parameterized element is not varied during the generating, based on the identification of the first parameterized element as a DNC element (108). A second value of the second parameterized element is varied during the generating (108).