Synopsys, Inc.
METHOD FOR FINDING EQUIVALENT CLASSES OF HARD DEFECTS IN STACKED MOSFET ARRAYS

Abstract:

In modern VLSI technology, often, stacked arrays of smaller sized MOSFETs are used to achieve the desired width and length of a design MOSFET. In analog defect simulation, each physical transistor can contribute to the circuit's defect universe and this can directly lead to tremendous increase in defect simulation time. Here we propose a method of finding equivalent defects in the context of stacked MOSFET arrays that can lead to significant reduction in defect simulation effort and yet provide accurate defect coverage results.