Synopsys, Inc.
DESIGN UNDER TEST PIN LOCATION DRIVEN SIMULTANEOUS SIGNAL GROUPING AND PIN ASSIGNMENT

Abstract:

A method includes generating a channel configuration between a first signal pin of a first integrated circuit (IC) die and a second signal pin of a second IC die based on a multiplex data rate (XDR) of the first signal pin and the second signal pin. The channel configuration includes an association of the XDR to a channel. The method also includes determining a signal pin channel assignment based on the channel configuration, updating the channel configuration based on the signal pin channel assignment and a wirelength representative of a total distance between the first signal pin, the second signal pin, and physical ports of the channel, and performing socket instantiation based on the updated channel configuration and the signal pin channel assignment.