Synopsys, Inc.
Extreme cases sampling method for improved variation-aware full custom design

Abstract:

The independent claims of this patent signify a concise description of embodiments. Roughly described, disclosed is technology for yield improvement of an integrated circuit device implementing a circuit design which includes, in a first verification, verifying adherence of the circuit design to a set of performance specifications, over a first set of test cases which include variations in a fabrication process variable or an environmental condition. The verification includes identifying, for each test case of the first set of test cases, an extent to which the circuit design satisfies one or more of the performance specifications of the set of performance specifications. A second circuit design is then developed to address corner cases identified in the first verification, and the second circuit design is then re-verified using only a subset of test cases having test cases fewer than test cases of the first set of test cases.