Synopsys, Inc.
Automatic definition and extraction of functional coverage metric for emulation-based verification

Abstract:

A method of verifying a circuit design, includes, in part, identifying a first groups of signals associated with the circuit, selecting a signal sampling window depth, performing a first verification of the circuit using a first test bench adapted to cause transitions in the first group of signals, storing values of the signals in the first group during each of the cycles defined by the sapling window depth to generate a first functional coverage, performing a second verification of the circuit design using a second test bench to generate a second functional coverage, comparing the second functional coverage to the first functional coverage, and automatically generating one or more cover property statements if the second functional coverage is less than the first functional coverage. The one or more cover property statements cause the second functional coverage to become equal to or greater than the first functional coverage.