Synopsys, Inc.
Video overlay

Abstract:

A method includes automatically aligning a laser-based timing analysis image of a semiconductor device with an image of a layout of the device. The method further includes controlling a speed at which a multitude of images subsequently obtained by the laser-based timing analysis are compared to the layout of the device to create a video overlay. The method further includes analyzing a multitude of potential failures of the semiconductor device by detecting movements of a multitude of hotspots on the layout as shown by the video overlay.