Synaptics Incorporated
METHOD AND SYSTEM FOR MEASURING A PHASE BASELINE ESTIMATE OF AN INPUT DEVICE

Abstract:

An input device may include various sensor electrodes that define various sensor pixels. The input device may further include a processing system coupled to the sensor electrodes. The processing system may obtain a first resulting signal and a second resulting signal from the sensor electrodes. The processing system may determine, using the first resulting signal, an in-phase estimate of a phase delay at a sensor pixel among the sensor pixels. The processing system may determine, using the second resulting signal, a quadrature estimate of the phase delay at the sensor pixel. The processing system may determine, based at least in part on the in-phase estimate and the quadrature estimate, a phase baseline estimate of the sensor pixels.