Taiwan Semiconductor Manufacturing Company Limited
FINFET ISOLATION STRUCTURE AND METHOD FOR FABRICATING THE SAME
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Abstract:
A semiconductor device includes a semiconductor device and a semiconductor fin on the semiconductor substrate, in which the semiconductor fin has a fin isolation structure at a common boundary that is shared by the two cells. The fin isolation structure has an air gap extending from a top of the semiconductor fin to a stop layer on the semiconductor substrate. The air gap divides the semiconductor fin into two portions of the semiconductor fin. The fin isolation structure includes a dielectric cap layer capping a top of the air gap.
Status:
Application
Type:
Utility
Filling date:
12 Apr 2021
Issue date:
29 Jul 2021