Taiwan Semiconductor Manufacturing Company Limited
Non-volatile static random access memory (nvSRAM) with multiple magnetic tunnel junction cells
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Abstract:
Disclosed herein is an integrated circuit including multiple magnetic tunneling junction (MTJ) cells coupled to a static random access memory (SRAM). In one aspect, the integrated circuit includes a SRAM having a first port and a second port, and a set of pass transistors coupled to the first port of the SRAM. In one aspect, the integrated circuit includes a set of MTJ cells, where each of the set of MTJ cells is coupled between a select line and a corresponding one of the set of pass transistors.
Status:
Grant
Type:
Utility
Filling date:
31 Dec 2019
Issue date:
31 Aug 2021