Taiwan Semiconductor Manufacturing Company Limited
Metal patterning for internal cell routing
Last updated:
Abstract:
A semiconductor device or structure includes a first pattern metal layer disposed between a first supply metal tract and a second supply metal tract, the first pattern metal layer comprising an internal route and a power route. A follow pin couples the first supply metal to the power route. The first supply metal tract comprises a first metal and a follow pin comprises a second metal.
Status:
Grant
Type:
Utility
Filling date:
20 Apr 2020
Issue date:
28 Sep 2021