Taiwan Semiconductor Manufacturing Company Limited
 Metal patterning for internal cell routing
 Last updated:
Abstract:
A semiconductor device or structure includes a first pattern metal layer disposed between a first supply metal tract and a second supply metal tract, the first pattern metal layer comprising an internal route and a power route. A follow pin couples the first supply metal to the power route. The first supply metal tract comprises a first metal and a follow pin comprises a second metal.
Status: 
 
                        Grant 
Type: 
 Utility
Filling date: 
 20 Apr 2020
Issue date: 
28 Sep 2021