Taiwan Semiconductor Manufacturing Company Limited
Semiconductor device and method of manufacture

Last updated:

Abstract:

A semiconductor device includes a first conductive feature and a second conductive feature. A first passivation layer is positioned between the first conductive feature and the second conductive feature. A second passivation layer is positioned between the first conductive feature and the second conductive feature and over the first passivation layer. A lowermost portion of an interface where the first passivation layer contacts the second passivation layer is positioned below 40% or above 60% of a height of the first conductive feature.

Status:
Grant
Type:

Utility

Filling date:

11 Feb 2020

Issue date:

28 Dec 2021