Taiwan Semiconductor Manufacturing Company Limited
 MEMORY CELL WITH LOW RESISTANCE TOP ELECTRODE CONTACT AND METHODS FOR FORMING THE SAME
 Last updated:
Abstract:
A magnetic tunnel junction (MTJ) memory cell comprising a connection via structure, a bottom electrode disposed on the connection via structure, a memory material stack disposed on the bottom electrode, and a conductive contact structure disposed on the memory material stack, in which a bottom surface of the conductive contact structure is in direct contact with a memory material layer of the memory material stack.
Status: 
 
                        Application 
Type: 
 Utility
Filling date: 
 14 Apr 2021
Issue date: 
23 Dec 2021