Taiwan Semiconductor Manufacturing Company Limited
High-density semiconductor device
Last updated:
Abstract:
A method of manufacturing a semiconductor device includes depositing a first material on a substrate, depositing on the substrate a second material that has an etch selectivity different from an etch selectively of the first material, depositing a spacer material on the first and second material, and etching the substrate using the spacer material as an etch mask to form a fin under the first material and a fin under the second material.
Status:
Grant
Type:
Utility
Filling date:
14 Oct 2019
Issue date:
16 Mar 2021