Taiwan Semiconductor Manufacturing Company Limited
Method of fabricating semiconductor structure

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Abstract:

The present disclosure provides a method of fabricating a semiconductor structure, and the method includes following steps. A gate structure is formed on a substrate, and a liner layer is formed to cover the gate structure and the substrate. A spacer layer is formed on the liner layer, and an etching gas is continuously provided to remove a portion of the spacer layer while maintaining the substrate at a second pressure, which the etching gas has a first pressure. The second pressure is greater than the first pressure.

Status:
Grant
Type:

Utility

Filling date:

30 Nov 2018

Issue date:

20 Oct 2020