Taiwan Semiconductor Manufacturing Company Limited
Method of forming MOSFET structure

Last updated:

Abstract:

A method includes providing a semiconductor structure that includes an epitaxial layer and a cap layer above the epitaxial layer, filling a trench above the cap layer with a sacrificial layer, and removing the sacrificial layer. As such, the cap layer is protected by the sacrificial layer during an etching process and the epitaxial layer is protected by the cap layer during another etching process.

Status:
Grant
Type:

Utility

Filling date:

4 May 2016

Issue date:

29 Oct 2019