Taiwan Semiconductor Manufacturing Company Limited
High-density semiconductor device

Last updated:

Abstract:

A method of manufacturing a semiconductor device includes depositing a first material on a substrate, depositing on the substrate a second material that has an etch selectivity different from an etch selectively of the first material, depositing a spacer material on the first and second material, and etching the substrate using the spacer material as an etch mask to form a fin under the first material and a fin under the second material.

Status:
Grant
Type:

Utility

Filling date:

3 May 2017

Issue date:

15 Oct 2019