Taiwan Semiconductor Manufacturing Company Limited
 High-Density Semiconductor Device
 Last updated:
Abstract:
A method of manufacturing a semiconductor device includes depositing a first material on a substrate, depositing on the substrate a second material that has an etch selectivity different from an etch selectively of the first material, depositing a spacer material on the first and second material, and etching the substrate using the spacer material as an etch mask to form a fin under the first material and a fin under the second material.
Status: 
 
                        Application 
Type: 
 Utility
Filling date: 
 9 Feb 2021
Issue date: 
3 Jun 2021