Taiwan Semiconductor Manufacturing Company Limited
WAFER POLISHING WITH SEPARATED CHEMICAL REACTION AND MECHANICAL POLISHING

Abstract:

A wafer is polished by performing a chemical reaction to change a property of a first portion of a material layer on the wafer using a first chemical substance. A first rinse is performed to remove the first chemical substance and retard the chemical reaction. A mechanical polishing process is then performed to remove the first portion of the material layer.