Taiwan Semiconductor Manufacturing Company Limited
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATION
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Abstract:
A semiconductor device is provided. The semiconductor device has a semiconductor layer comprising a source/drain region, a first magnetic layer over the semiconductor layer, and a first dielectric layer over the source/drain region and adjacent the first magnetic layer. The semiconductor device has a metal structure extending through the first dielectric layer, a second magnetic layer over the metal structure, and a second dielectric layer over the first magnetic layer and adjacent the first dielectric layer.
Status:
Application
Type:
Utility
Filling date:
1 May 2019
Issue date:
30 Apr 2020