Texas Instruments Incorporated
CRACK SUPPRESSION STRUCTURE FOR HV ISOLATION COMPONENT

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Abstract:

An integrated circuit (IC) includes a substrate having functional circuitry for realizing at least one circuit function configured together with at least one high voltage isolation component including a top metal feature above the substrate. A crack suppressing dielectric structure including at least a crack resistant dielectric layer is on at least a top of the top metal feature. At least one dielectric passivation overcoat (PO) layer is on an outer portion of the top metal feature.

Status:
Application
Type:

Utility

Filling date:

25 May 2021

Issue date:

9 Sep 2021