Texas Instruments Incorporated
INTEGRATED CIRCUIT WITH EMBEDDED TESTING CIRCUITRY

Abstract:

An integrated circuit, comprising a plurality of pins, including a signal output pin. The integrated circuit also comprises a plurality of signal nodes. Each node in the plurality of signal nodes is operable to store a respective internal data signal. The integrated circuit also comprises a plurality of testing circuits. Each testing circuit in the plurality of testing circuits configured to sample a respective internal data state and in response to concurrently couple a unique output signal to a same pin in the plurality of pins, other than the signal output pin.