Texas Instruments Incorporated
INTEGRATED CIRCUIT WITH SCRIBE LANE PATTERNS FOR DEFECT REDUCTION

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Abstract:

An integrated circuit includes a circuit area, and first and second scribe line portions. The first scribe line portion borders a first side of the circuit area, and the second scribe line portion borders a different second side of the circuit area. A plurality of dummy metal structures are located in the first and second scribe line portions, each of the dummy metal structures being located about at a lattice point of a same two-dimensional grid.

Status:
Application
Type:

Utility

Filling date:

15 Jul 2021

Issue date:

23 Dec 2021