Texas Instruments Incorporated
INTEGRATED CIRCUIT WITH SCRIBE LANE PATTERNS FOR DEFECT REDUCTION
Last updated:
Abstract:
An integrated circuit includes a circuit area, and first and second scribe line portions. The first scribe line portion borders a first side of the circuit area, and the second scribe line portion borders a different second side of the circuit area. A plurality of dummy metal structures are located in the first and second scribe line portions, each of the dummy metal structures being located about at a lattice point of a same two-dimensional grid.
Status:
Application
Type:
Utility
Filling date:
15 Jul 2021
Issue date:
23 Dec 2021