Texas Instruments Incorporated
OPERATING MODES FOR TESTING MONITOR CIRCUITS

Abstract:

A system is provided. In some examples, the system includes a control circuit and a plurality of monitor circuits including a first monitor circuit. In a production mode, the control circuit is configured to test the plurality of monitor circuits. In a storage mode after testing the plurality of monitor circuits in the production mode, the control circuit is configured to test the plurality of monitor circuits more than once. In an assembly mode after testing the plurality of monitor circuits in the storage mode, the control circuit is configured to test the plurality of monitor circuits. In one or more examples, the control circuit is configured to skip the storage mode and test the plurality of monitor circuits in the assembly mode after testing in the production mode.