Texas Instruments Incorporated
Uniform implant regions in a semiconductor ridge of a FinFET
Last updated:
Abstract:
A method for fabricating an integrated circuit is disclosed. The method comprises forming a semiconductor ridge over a semiconductor surface of a substrate and forming an implant screen on a top and sidewalls of the semiconductor ridge. The implant screen is at least two times thicker on the top of the semiconductor ridge relative to the sidewalls of the semiconductor ridge. The method further comprises implanting a dopant into the top and sidewalls of the semiconductor ridge.
Status:
Grant
Type:
Utility
Filling date:
30 Dec 2020
Issue date:
6 Sep 2022