Texas Instruments Incorporated
Isolation structure for IC with epi regions sharing the same tank
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Abstract:
An integrated circuit (IC) includes a semiconductor substrate in which a plurality of spaced-apart deep trench (DT) structures are formed. The IC further includes a plurality of DEEPN diffusion regions, each DEEPN diffusion region surrounding a corresponding one of the DT structures. Each of the DEEPN diffusion regions merges with at least one neighboring DEEPN diffusion region that surrounds at least one neighboring DT structure. The merged DEEPN diffusion regions may partially isolate two electronic devices, e.g. ESD devices.
Status:
Grant
Type:
Utility
Filling date:
29 Oct 2019
Issue date:
13 Sep 2022