Texas Instruments Incorporated
Methods and apparatus to measure and analyze vibration signatures

Abstract:

Methods and apparatus to measure and analyze vibration signatures are disclosed. In some examples, a meter is provided comprising a waveform generator to generate a waveform based on first distance measurements of an object. In some examples, the meter includes a waveform generator to determine a first vibration characteristic of the object based on the waveform. In some examples, the meter includes a comparator to compare the first vibration characteristic to a signature vibration characteristic of the object, the signature vibration characteristic of the object indicative of normal characteristics of the object. In some examples, the meter includes a reporter to, in response to determining the first vibration characteristic does not match the signature vibration characteristic, generate an alert.