Lam Research Corporation
RF IMMUNE SENSOR PROBE FOR MONITORING A TEMPERATURE OF AN ELECTROSTATIC CHUCK OF A SUBSTRATE PROCESSING SYSTEM

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Abstract:

A sensor probe includes an elongated body defining an inner cavity having an inner diameter. A printed circuit board is configured to be fitted within the inner cavity. A first temperature-sensing integrated circuit mounted at a first end of the printed circuit board. A cap is mounted to a first end of the elongated body adjacent to the first temperature-sensing integrated circuit. A housing is configured to receive a second end of the elongated body, wherein the housing is configured to be mounted to a baseplate of a substrate support.

Status:
Application
Type:

Utility

Filling date:

29 May 2020

Issue date:

28 Jul 2022