Lam Research Corporation
ATOMIC LAYER ETCH OF TUNGSTEN FOR ENHANCED TUNGSTEN DEPOSITION FILL

Last updated:

Abstract:

Methods of depositing tungsten into high aspect ratio features using a dep-etch-dep process integrating various deposition techniques with alternating pulses of surface modification and removal during etch are provided herein.

Status:
Application
Type:

Utility

Filling date:

26 May 2020

Issue date:

10 Sep 2020