Lam Research Corporation
ATOMIC LAYER ETCHING OF TUNGSTEN FOR ENHANCED TUNGSTEN DEPOSITION FILL

Last updated:

Abstract:

Methods of depositing tungsten into high aspect ratio features using a dep-etch-dep process integrating various deposition techniques with alternating pulses of surface modification and removal during etch are provided herein.

Status:
Application
Type:

Utility

Filling date:

15 Jun 2021

Issue date:

30 Sep 2021