Lam Research Corporation
ATOMIC LAYER ETCHING OF TUNGSTEN FOR ENHANCED TUNGSTEN DEPOSITION FILL
Last updated:
Abstract:
Methods of depositing tungsten into high aspect ratio features using a dep-etch-dep process integrating various deposition techniques with alternating pulses of surface modification and removal during etch are provided herein.
Status:
Application
Type:
Utility
Filling date:
15 Jun 2021
Issue date:
30 Sep 2021