Lam Research Corporation
HIGH ETCH SELECTIVITY, LOW STRESS ASHABLE CARBON HARD MASK
Last updated:
Abstract:
A method for depositing a carbon ashable hard mask layer on a substrate includes a) arranging a substrate in a processing chamber; b) setting chamber pressure in a predetermined pressure range; c) setting a substrate temperature in a predetermined temperature range from -20.degree. C. to 200.degree. C.; d) supplying a gas mixture including hydrocarbon precursor and one or more other gases; and e) striking plasma by supplying RF plasma power for a first predetermined period to deposit a carbon ashable hard mask layer on the substrate.
Status:
Application
Type:
Utility
Filling date:
18 Mar 2020
Issue date:
9 Jun 2022