Lam Research Corporation
HIGH ETCH SELECTIVITY, LOW STRESS ASHABLE CARBON HARD MASK

Last updated:

Abstract:

A method for depositing a carbon ashable hard mask layer on a substrate includes a) arranging a substrate in a processing chamber; b) setting chamber pressure in a predetermined pressure range; c) setting a substrate temperature in a predetermined temperature range from -20.degree. C. to 200.degree. C.; d) supplying a gas mixture including hydrocarbon precursor and one or more other gases; and e) striking plasma by supplying RF plasma power for a first predetermined period to deposit a carbon ashable hard mask layer on the substrate.

Status:
Application
Type:

Utility

Filling date:

18 Mar 2020

Issue date:

9 Jun 2022