PDF Solutions, Inc.
Collaborative Learning Model for Semiconductor Applications
Last updated:
Abstract:
Classifying wafers using Collaborative Learning. An initial wafer classification is determined by a rule-based model. A predicted wafer classification is determined by a machine learning model. Multiple users can manually review the classifications to confirm or modify, or to add user classifications. All of the classifications are input to the machine learning model to continuously update its scheme for detection and classification.
Status:
Application
Type:
Utility
Filling date:
14 Oct 2020
Issue date:
13 May 2021