PDF Solutions, Inc.
Collaborative Learning Model for Semiconductor Applications

Last updated:

Abstract:

Classifying wafers using Collaborative Learning. An initial wafer classification is determined by a rule-based model. A predicted wafer classification is determined by a machine learning model. Multiple users can manually review the classifications to confirm or modify, or to add user classifications. All of the classifications are input to the machine learning model to continuously update its scheme for detection and classification.

Status:
Application
Type:

Utility

Filling date:

14 Oct 2020

Issue date:

13 May 2021