| Utility: Predicting die susceptible to early lifetime failure Filling date: 5 Sep 2025 Issue date: 10 May 2022 | 2 Mar 2021 | 10 May 2022 |
| Utility: Methods for aligning a particle beam and performing a non-contact electrical measurement on a cell using a registration cell Filling date: 5 Sep 2025 Issue date: 10 May 2022 | 1 Oct 2020 | 10 May 2022 |
| Utility: Maintenance scheduling for semiconductor manufacturing equipment Filling date: 5 Sep 2025 Issue date: 5 Apr 2022 | 25 Aug 2020 | 5 Apr 2022 |
| Utility: Sequenced Approach For Determining Wafer Path Quality Filling date: 5 Sep 2025 Issue date: 3 Mar 2022 | 27 Aug 2021 | 3 Mar 2022 |
| Utility: Pattern-Enhanced Spatial Correlation of Test Structures to Die Level Responses Filling date: 5 Sep 2025 Issue date: 10 Feb 2022 | 6 Aug 2021 | 10 Feb 2022 |
| Utility: Automatic Window Generation for Process Trace Filling date: 5 Sep 2025 Issue date: 27 Jan 2022 | 22 Jul 2021 | 27 Jan 2022 |
| Utility: Predicting Equipment Fail Mode from Process Trace Filling date: 5 Sep 2025 Issue date: 27 Jan 2022 | 22 Jul 2021 | 27 Jan 2022 |
| Utility: Wafer Bin Map Based Root Cause Analysis Filling date: 5 Sep 2025 Issue date: 4 Nov 2021 | 30 Apr 2021 | 4 Nov 2021 |
| Utility: Abnormal Wafer Image Classification Filling date: 5 Sep 2025 Issue date: 28 Oct 2021 | 22 Apr 2021 | 28 Oct 2021 |
| Utility: Rational Decision-Making Tool for Semiconductor Processes Filling date: 5 Sep 2025 Issue date: 23 Sep 2021 | 4 Jun 2021 | 23 Sep 2021 |
| Utility: Predicting Die Susceptible to Early Lifetime Failure Filling date: 5 Sep 2025 Issue date: 9 Sep 2021 | 2 Mar 2021 | 9 Sep 2021 |
| Utility: IC with test structures and e-beam pads embedded within a contiguous standard cell area Filling date: 5 Sep 2025 Issue date: 31 Aug 2021 | 30 Jun 2019 | 31 Aug 2021 |
| Utility: IC with test structures and e-beam pads embedded within a contiguous standard cell area Filling date: 5 Sep 2025 Issue date: 3 Aug 2021 | 30 Jun 2019 | 3 Aug 2021 |
| Utility: IC with test structures and e-beam pads embedded within a contiguous standard cell area Filling date: 5 Sep 2025 Issue date: 3 Aug 2021 | 30 Jun 2019 | 3 Aug 2021 |
| Utility: IC with test structures and E-beam pads embedded within a contiguous standard cell area Filling date: 5 Sep 2025 Issue date: 27 Jul 2021 | 30 Jun 2019 | 27 Jul 2021 |
| Utility: Failure detection and classsification using sensor data and/or measurement data Filling date: 5 Sep 2025 Issue date: 8 Jun 2021 | 8 Mar 2019 | 8 Jun 2021 |
| Utility: Generating robust machine learning predictions for semiconductor manufacturing processes Filling date: 5 Sep 2025 Issue date: 8 Jun 2021 | 12 Jun 2018 | 8 Jun 2021 |
| Utility: Semiconductor yield prediction Filling date: 5 Sep 2025 Issue date: 1 Jun 2021 | 24 Aug 2018 | 1 Jun 2021 |
| Utility: IC with test structures and e-beam pads embedded within a contiguous standard cell area Filling date: 5 Sep 2025 Issue date: 25 May 2021 | 30 Jun 2019 | 25 May 2021 |
| Utility: Collaborative Learning Model for Semiconductor Applications Filling date: 5 Sep 2025 Issue date: 13 May 2021 | 14 Oct 2020 | 13 May 2021 |
| Utility: DIE LEVEL PRODUCT MODELING WITHOUT DIE LEVEL INPUT DATA Filling date: 5 Sep 2025 Issue date: 22 Apr 2021 | 16 Oct 2020 | 22 Apr 2021 |
| Utility: MACHINE LEARNING VARIABLE SELECTION AND ROOT CAUSE DISCOVERY BY CUMULATIVE PREDICTION Filling date: 5 Sep 2025 Issue date: 22 Apr 2021 | 16 Oct 2020 | 22 Apr 2021 |
| Utility: IC with test structures and E-beam pads embedded within a contiguous standard cell area Filling date: 5 Sep 2025 Issue date: 13 Apr 2021 | 29 Jun 2019 | 13 Apr 2021 |
| Utility: Anomalous Equipment Trace Detection and Classification Filling date: 5 Sep 2025 Issue date: 8 Apr 2021 | 6 Oct 2020 | 8 Apr 2021 |
| Utility: SYSTEMS, DEVICES, AND METHODS FOR ALIGNING A PARTICLE BEAM AND PERFORMING A NON-CONTACT ELECTRICAL MEASUREMENT ON A CELL AND/OR NON-CONTACT ELECTRICAL MEASUREMENT CELL VEHICLE USING A REGISTRATION CELL Filling date: 5 Sep 2025 Issue date: 1 Apr 2021 | 1 Oct 2020 | 1 Apr 2021 |
| Utility: SYSTEMS, DEVICES, AND METHODS FOR PERFORMING A NON-CONTACT ELECTRICAL MEASUREMENT ON A CELL, NON-CONTACT ELECTRICAL MEASUREMENT CELL VEHICLE, CHIP, WAFER, DIE, OR LOGIC BLOCK Filling date: 5 Sep 2025 Issue date: 1 Apr 2021 | 1 Oct 2020 | 1 Apr 2021 |
| Utility: Characterization vehicles for printed circuit board and system design Filling date: 5 Sep 2025 Issue date: 19 Jan 2021 | 17 Dec 2019 | 19 Jan 2021 |
| Utility: MAINTENANCE SCHEDULING FOR SEMICONDUCTOR MANUFACTURING EQUIPMENT Filling date: 5 Sep 2025 Issue date: 10 Dec 2020 | 25 Aug 2020 | 10 Dec 2020 |
| Utility: Method for processing a semiconductor wafer using non-contact electrical measurements indicative of at least one tip-to-side short or leakage, at least one corner short or leakage, and at least one via open or resistance, where such measurements are obtained from non-contact pads associated with respective tip-to-side short, corner short, and via open test areas Filling date: 5 Sep 2025 Issue date: 1 Dec 2020 | 31 Mar 2018 | 1 Dec 2020 |
| Utility: Test structures for measuring silicon thickness in fully depleted silicon-on-insulator technologies Filling date: 5 Sep 2025 Issue date: 1 Dec 2020 | 1 Jun 2017 | 1 Dec 2020 |
| Utility: Snap-to valid pattern system and method Filling date: 5 Sep 2025 Issue date: 13 Oct 2020 | 5 Sep 2017 | 13 Oct 2020 |
| Utility: Selective inclusion/exclusion of semiconductor chips in accelerated failure tests Filling date: 5 Sep 2025 Issue date: 15 Sep 2020 | 26 Mar 2019 | 15 Sep 2020 |
| Utility: IC with test structures embedded within a contiguous standard cell area Filling date: 5 Sep 2025 Issue date: 15 Sep 2020 | 29 Sep 2018 | 15 Sep 2020 |
| Utility: Method and apparatus for direct testing and characterization of a three dimensional semiconductor memory structure Filling date: 5 Sep 2025 Issue date: 8 Sep 2020 | 4 Jun 2018 | 8 Sep 2020 |
| Utility: Direct memory characterization using periphery transistors Filling date: 5 Sep 2025 Issue date: 9 Jun 2020 | 6 Dec 2018 | 9 Jun 2020 |
| Utility: Failure detection for wire bonding in semiconductors Filling date: 5 Sep 2025 Issue date: 19 May 2020 | 21 Sep 2018 | 19 May 2020 |
| Utility: Passive array test structure for cross-point memory characterization Filling date: 5 Sep 2025 Issue date: 5 May 2020 | 11 Jul 2018 | 5 May 2020 |
| Utility: Method for applying charge-based-capacitance-measurement with switches using only NMOS or only PMOS transistors Filling date: 5 Sep 2025 Issue date: 5 May 2020 | 19 Sep 2016 | 5 May 2020 |
| Utility: CHARACTERIZATION VEHICLES FOR PRINTED CIRCUIT BOARD AND SYSTEM DESIGN Filling date: 5 Sep 2025 Issue date: 16 Apr 2020 | 17 Dec 2019 | 16 Apr 2020 |
| Utility: IC chips containing a mixture of standard cells obtained from an original set of design rules and enhanced standard cells that are a substantially uniform variant of the original set of design rules and methods for making the same Filling date: 5 Sep 2025 Issue date: 14 Apr 2020 | 7 Jul 2017 | 14 Apr 2020 |
| Utility: Process for making semiconductor dies, chips, and wafers using in-line measurements obtained from DOEs of NCEM-enabled fill cells Filling date: 5 Sep 2025 Issue date: 17 Mar 2020 | 4 Apr 2016 | 17 Mar 2020 |
| Utility: Standard cell design conformance using boolean assertions Filling date: 5 Sep 2025 Issue date: 18 Feb 2020 | 30 Nov 2018 | 18 Feb 2020 |
| Utility: Method for manufacturing a semiconductor product wafer Filling date: 5 Sep 2025 Issue date: 28 Jan 2020 | 18 Dec 2017 | 28 Jan 2020 |
| Utility: Test structures and method for electrical measurement of FinFET fin height Filling date: 5 Sep 2025 Issue date: 7 Jan 2020 | 19 Sep 2016 | 7 Jan 2020 |
| Utility: Characterization vehicles for printed circuit board and system design Filling date: 5 Sep 2025 Issue date: 24 Dec 2019 | 16 Oct 2018 | 24 Dec 2019 |
| Utility: CHARACTERIZATION VEHICLES FOR PRINTED CIRCUIT BOARD AND SYSTEM DESIGN Filling date: 5 Sep 2025 Issue date: 17 Oct 2019 | 16 Oct 2018 | 17 Oct 2019 |
| Utility: Direct access memory characterization vehicle Filling date: 5 Sep 2025 Issue date: 10 Sep 2019 | 23 Feb 2017 | 10 Sep 2019 |
| Utility: Direct probing characterization vehicle for transistor, capacitor and resistor testing Filling date: 5 Sep 2025 Issue date: 13 Aug 2019 | 22 Sep 2016 | 13 Aug 2019 |
