PDF Solutions, Inc.
IC with test structures embedded within a contiguous standard cell area

Last updated:

Abstract:

An IC includes a contiguous standard cell area with first, second, and third TS-GATE-short-configured test area geometries disposed therein. In some embodiments, the contiguous standard cell area may further include: fourth and fifth TS-GATE-short-configured test area geometries, and/or other test area geometries, such as tip-to-tip-short, tip-to-side-short, diagonal-short, corner-short, interlayer-overlap-short, via-chamfer-short, merged-via-short, snake-open, stitch-open, via-open, or metal-island-open.

Status:
Grant
Type:

Utility

Filling date:

29 Sep 2018

Issue date:

15 Sep 2020