| Utility: Method of centering probe head in mounting frame Filling date: 26 Sep 2025 Issue date: 1 Sep 2022 | 28 Feb 2022 | 1 Sep 2022 |
| Utility: Probe Head Including a Guide Plate with Angled Holes to Determine Probe Flexure Direction Filling date: 26 Sep 2025 Issue date: 28 Jul 2022 | 28 Jan 2022 | 28 Jul 2022 |
| Utility: Double-sided probe systems with thermal control systems and related methods Filling date: 26 Sep 2025 Issue date: 5 Jul 2022 | 3 Dec 2020 | 5 Jul 2022 |
| Utility: Probe systems and methods for testing a device under test Filling date: 26 Sep 2025 Issue date: 31 May 2022 | 21 Oct 2020 | 31 May 2022 |
| Utility: Probe systems and methods for characterizing optical coupling between an optical probe of a probe system and a calibration structure Filling date: 26 Sep 2025 Issue date: 26 Apr 2022 | 22 Sep 2020 | 26 Apr 2022 |
| Utility: Probe on carrier architecture for vertical probe arrays Filling date: 26 Sep 2025 Issue date: 5 Apr 2022 | 27 Apr 2020 | 5 Apr 2022 |
| Utility: Methods for maintaining gap spacing between an optical probe of a probe system and an optical device of a device under test, and probe systems that perform the methods Filling date: 26 Sep 2025 Issue date: 21 Dec 2021 | 29 Jun 2020 | 21 Dec 2021 |
| Utility: Multi-Conductor Transmission Line Probe Filling date: 26 Sep 2025 Issue date: 16 Dec 2021 | 11 Jun 2021 | 16 Dec 2021 |
| Utility: 3D electrical integration using component carrier edge connections to a 2D contact array Filling date: 26 Sep 2025 Issue date: 2 Dec 2021 | 28 May 2021 | 2 Dec 2021 |
| Utility: METHODS OF PRODUCING AUGMENTED PROBE SYSTEM IMAGES AND ASSOCIATED PROBE SYSTEMS Filling date: 26 Sep 2025 Issue date: 2 Dec 2021 | 6 May 2021 | 2 Dec 2021 |
| Utility: Probe systems and methods including electric contact detection Filling date: 26 Sep 2025 Issue date: 23 Nov 2021 | 23 May 2019 | 23 Nov 2021 |
| Utility: Electrical test probes having decoupled electrical and mechanical design Filling date: 26 Sep 2025 Issue date: 26 Oct 2021 | 13 Jun 2019 | 26 Oct 2021 |
| Utility: MEMS probe card assembly having decoupled electrical and mechanical probe connections Filling date: 26 Sep 2025 Issue date: 26 Oct 2021 | 30 Oct 2018 | 26 Oct 2021 |
| Utility: Probe systems for optically probing a device under test and methods of operating the probe systems Filling date: 26 Sep 2025 Issue date: 28 Sep 2021 | 15 Sep 2020 | 28 Sep 2021 |
| Utility: Beamforming Device Testing Filling date: 26 Sep 2025 Issue date: 8 Jul 2021 | 7 Jan 2021 | 8 Jul 2021 |
| Utility: Probe tip with embedded skate Filling date: 26 Sep 2025 Issue date: 6 Jul 2021 | 22 Mar 2019 | 6 Jul 2021 |
| Utility: Calibration chucks for optical probe systems, optical probe systems including the calibration chucks, and methods of utilizing the optical probe systems Filling date: 26 Sep 2025 Issue date: 29 Jun 2021 | 27 May 2020 | 29 Jun 2021 |
| Utility: Probe systems and methods Filling date: 26 Sep 2025 Issue date: 29 Jun 2021 | 11 Oct 2019 | 29 Jun 2021 |
| Utility: DOUBLE-SIDED PROBE SYSTEMS WITH THERMAL CONTROL SYSTEMS AND RELATED METHODS Filling date: 26 Sep 2025 Issue date: 24 Jun 2021 | 3 Dec 2020 | 24 Jun 2021 |
| Utility: Methods of controlling the operation of probe stations and probe stations that perform the methods, the methods including generating and executing a test routine that directs the probe station to electrically test a test subset of a plurality of DUTs and to pre-test a pre-test subset of a plurality of DUTs, which is a subset of the test subset, with a pre-test Filling date: 26 Sep 2025 Issue date: 25 May 2021 | 23 May 2019 | 25 May 2021 |
| Utility: Probe on carrier architecture for vertical probe arrays Filling date: 26 Sep 2025 Issue date: 29 Oct 2020 | 27 Apr 2020 | 29 Oct 2020 |
| Utility: Shielding for vertical probe heads Filling date: 26 Sep 2025 Issue date: 24 Mar 2020 | 11 Jan 2018 | 24 Mar 2020 |
| Utility: Vertical probe array having a tiled membrane space transformer Filling date: 26 Sep 2025 Issue date: 3 Mar 2020 | 29 Aug 2018 | 3 Mar 2020 |
| Utility: Probe head with inductance reducing structure Filling date: 26 Sep 2025 Issue date: 7 Jan 2020 | 22 Jun 2018 | 7 Jan 2020 |
| Utility: Electrical test probes having decoupled electrical and mechanical design Filling date: 26 Sep 2025 Issue date: 19 Dec 2019 | 13 Jun 2019 | 19 Dec 2019 |
| Utility: Probe tip with embedded skate Filling date: 26 Sep 2025 Issue date: 26 Sep 2019 | 22 Mar 2019 | 26 Sep 2019 |
