Nova Ltd.
Patents, Design & Utilities
Last updated:
List of all Nova Ltd. patents 46 in total
| Status | Patent |
|---|---|
Application | Utility: INTEGRATED MEASUREMENT SYSTEM Filling date: 5 Sep 2025 Issue date: 23 Dec 2021 |
Application | Utility: OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM Filling date: 5 Sep 2025 Issue date: 25 Nov 2021 |
Application | Utility: SCATTEROMETRY SYSTEM AND METHOD Filling date: 5 Sep 2025 Issue date: 23 Sep 2021 |
Application | Utility: OPTICAL TECHNIQUE FOR MATERIAL CHARACTERIZATION Filling date: 5 Sep 2025 Issue date: 23 Sep 2021 |
Grant | Utility: X-ray based measurements in patterned structure Filling date: 5 Sep 2025 Issue date: 24 Aug 2021 |
Grant | Utility: Metrology and process control for semiconductor manufacturing Filling date: 5 Sep 2025 Issue date: 17 Aug 2021 |
Application | Utility: TIME-DOMAIN OPTICAL METROLOGY AND INSPECTION OF SEMICONDUCTOR DEVICES Filling date: 5 Sep 2025 Issue date: 12 Aug 2021 |
Application | Utility: ACCURATE RAMAN SPECTROSCOPY Filling date: 5 Sep 2025 Issue date: 22 Jul 2021 |
Application | Utility: TEM-BASED METROLOGY METHOD AND SYSTEM Filling date: 5 Sep 2025 Issue date: 15 Jul 2021 |
Grant | Utility: Optical phase measurement method and system Filling date: 5 Sep 2025 Issue date: 8 Jun 2021 |
Application | Utility: SYSTEM AND METHOD FOR MEASURING A SAMPLE BY X-RAY REFLECTANCE SCATTEROMETRY Filling date: 5 Sep 2025 Issue date: 3 Jun 2021 |
Application | Utility: RAMAN SPECTROSCOPY BASED MEASUREMENT SYSTEM Filling date: 5 Sep 2025 Issue date: 3 Jun 2021 |
Application | Utility: METROLOGY AND PROCESS CONTROL FOR SEMICONDUCTOR MANUFACTURING Filling date: 5 Sep 2025 Issue date: 20 May 2021 |
Application | Utility: METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES Filling date: 5 Sep 2025 Issue date: 22 Apr 2021 |
Grant | Utility: Method and system for processing patterned structures Filling date: 5 Sep 2025 Issue date: 13 Apr 2021 |
Grant | Utility: Scatterometry system and method Filling date: 5 Sep 2025 Issue date: 6 Apr 2021 |
Application | Utility: METHOD AND SYSTEM FOR OPTIMIZING OPTICAL INSPECTION OF PATTERNED STRUCTURES Filling date: 5 Sep 2025 Issue date: 25 Mar 2021 |
Grant | Utility: TEM-based metrology method and system Filling date: 5 Sep 2025 Issue date: 9 Feb 2021 |
Application | Utility: HYBRID METROLOGY METHOD AND SYSTEM Filling date: 5 Sep 2025 Issue date: 7 Jan 2021 |
Application | Utility: PROCESS CONTROL OF SEMICONDUCTOR FABRICATION BASED ON SPECTRA QUALITY METRICS Filling date: 5 Sep 2025 Issue date: 31 Dec 2020 |
Grant | Utility: Method and system for optical characterization of patterned samples Filling date: 5 Sep 2025 Issue date: 29 Dec 2020 |
Application | Utility: OPTICAL PHASE MEASUREMENT SYSTEM AND METHOD Filling date: 5 Sep 2025 Issue date: 12 Nov 2020 |
Application | Utility: METROLOGY METHOD AND SYSTEM Filling date: 5 Sep 2025 Issue date: 17 Sep 2020 |
Application | Utility: PROCESS CONTROL OF SEMICONDUCTOR FABRICATION BASED ON LINKAGE BETWEEN DIFFERENT FABRICATION STEPS Filling date: 5 Sep 2025 Issue date: 3 Sep 2020 |
Grant | Utility: Method and system for optical metrology in patterned structures Filling date: 5 Sep 2025 Issue date: 1 Sep 2020 |
Application | Utility: RAMAN SPECTROSCOPY BASED MEASUREMENTS IN PATTERNED STRUCTURES Filling date: 5 Sep 2025 Issue date: 13 Aug 2020 |
Grant | Utility: Optical system and method for measurements of samples Filling date: 5 Sep 2025 Issue date: 11 Aug 2020 |
Grant | Utility: Hybrid metrology method and system Filling date: 5 Sep 2025 Issue date: 4 Aug 2020 |
Application | Utility: MEASURING COMPLEX STRUCTURES IN SEMICONDUCTOR FABRICATION Filling date: 5 Sep 2025 Issue date: 18 Jun 2020 |
Application | Utility: LAYER DETECTION FOR HIGH ASPECT RATIO ETCH CONTROL Filling date: 5 Sep 2025 Issue date: 18 Jun 2020 |
Grant | Utility: Optical phase measurement system and method Filling date: 5 Sep 2025 Issue date: 26 May 2020 |
Grant | Utility: Measuring complex structures in semiconductor fabrication Filling date: 5 Sep 2025 Issue date: 26 May 2020 |
Application | Utility: METHOD AND SYSTEM FOR OPTIMIZING OPTICAL INSPECTION OF PATTERNED STRUCTURES Filling date: 5 Sep 2025 Issue date: 20 Feb 2020 |
Application | Utility: TEST STRUCTURE DESIGN FOR METROLOGY MEASUREMENTS IN PATTERNED SAMPLES Filling date: 5 Sep 2025 Issue date: 20 Feb 2020 |
Grant | Utility: Raman spectroscopy based measurements in patterned structures Filling date: 5 Sep 2025 Issue date: 18 Feb 2020 |
Application | Utility: OPTICAL PHASE MEASUREMENT SYSTEM AND METHOD Filling date: 5 Sep 2025 Issue date: 23 Jan 2020 |
Application | Utility: SCATTEROMETRY SYSTEM AND METHOD Filling date: 5 Sep 2025 Issue date: 16 Jan 2020 |
Grant | Utility: Method for use in process control of manufacture of patterned sample Filling date: 5 Sep 2025 Issue date: 14 Jan 2020 |
Application | Utility: AN APPARATUS AND METHOD FOR ELECTRICAL TEST PREDICTION Filling date: 5 Sep 2025 Issue date: 2 Jan 2020 |
Application | Utility: TEM-BASED METROLOGY METHOD AND SYSTEM Filling date: 5 Sep 2025 Issue date: 26 Dec 2019 |
Application | Utility: MONITORING SYSTEM AND METHOD FOR VERIFYING MEASUREMENTS IN PATTENED STRUCTURES Filling date: 5 Sep 2025 Issue date: 7 Nov 2019 |
Application | Utility: OPTICAL SYSTEM AND METHOD FOR MEASURING PARAMETERS OF PATTERNED STRUCTURES IN MICRO-ELECTRONIC DEVICES Filling date: 5 Sep 2025 Issue date: 7 Nov 2019 |
Application | Utility: METHOD AND SYSTEM FOR OPTICAL METROLOGY IN PATTERNED STRUCTURES Filling date: 5 Sep 2025 Issue date: 17 Oct 2019 |
Grant | Utility: Scatterometry system and method Filling date: 5 Sep 2025 Issue date: 6 Aug 2019 |
Grant | Utility: Optical critical dimension metrology Filling date: 5 Sep 2025 Issue date: 30 Jul 2019 |
Grant | Utility: Optical phase measurement method and system Filling date: 5 Sep 2025 Issue date: 30 Jul 2019 |
Showing 1 to 46 of 46 patents.